How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如
短设计周期、降低芯片成本而又不损失芯片性能的前提下
成SOC系统芯片的测试是芯片设计工程师和测试工程师当前所
对的挑战。
